- Facilities at CRL
- Scanning Electron Microscopes (SEM) with EDX
- X Ray Diffractometer (XRD)
- Energy Dispersive X Ray Fluorescence Spectroscopy
- Universal Testing Machine (UTM)
- Gas Chromatography (GC)
- Gas Chromatography Mass Spectroscopy (GC MS)
- High Performance Liquid Chromatography (HPLC)
- Preparative HPLC
- Atomic Absorption Spectrometer (AAS)
- Flame Photometer
- Dynamic Mechanical Analyzer (DMA)
- Surface Area and Pore Size Analyzer (SAA)
- Simultaneous Thermal Analyzer (STA)
- Bomb Calorimeter
- Zeta Sizer
- Fluorescent Spectrophotometer
- Ultraviolet Near Infrared Spectrometer
- Ultraviolet Visible Spectrometer
- Ultraviolet Visible Diffused Reflectance Spectrometer
- Fourier Transform Infrared Spectrometer
- High Speed Centrifuge
- Liquid Nitrogen Plant (LN2 Plant)
- TEM Sample Preparation Units
- High Temperature Furnaces
- Coating Units
- Viscometery
- Accessories
- Vibrating Sample Magnetometer (VSM)
Centralized Resource Laboratory
Transmission Electron Microscope (TEM) with EDX
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Specifications:
Model: JEM-2100
Manufacturer: JEOL, Japan
Acc. Voltage: 200KV
Magnification (Max): 1,500,000X
Resolving power (Max): 1.4Å
Attachments:
1. Energy Dispersive X-Ray Spectrometer (EDX)
INCA100/ Oxford instruments, U.K.
(Analysis range is Boron to Uranium)
2. CCD Camera
Orious SC600, Gatan, USA
Bottom mount, 7MP